9-13 July 2012
Africa/Johannesburg timezone
<a href="http://events.saip.org.za/internalPage.py?pageId=11&confId=14"><font color=#ff0000>SAIP2012 PROCEEDINGS AVAILABLE</font></a>

Modal Analysis through Complex Amplitude and Phase modulation

12 Jul 2012, 17:00
20m
Oral Presentation Track C - Photonics Photonics

Speaker

Mr Darryl Naidoo (Council for Scientific and Industrial Research)

Apply to be<br> consider for a student <br> &nbsp; award (Yes / No)?

Yes

Abstract content <br> &nbsp; (Max 300 words)

We explore an alternative to the Correlation Filter Method (CFM) for the real-time analysis of laser modes using a phase-only spatial light modulator (SLM) operating in reflection mode. This procedure involves encoding a set of orthonormal basis functions into digital holograms by complex amplitude modulation into which the initial field is decomposed. The advantage of such an approach over the CFM is that prior knowledge of the field is not required and this technique allows any function to be encoded with real-time switching of the digital holograms on the SLM. We implement a modal decomposition on a set of modes propagating in a multimode optical fibre supporting 6 LP modes at λ = 1.064 μm (Core diameter = 25 μm, NA = 0.064, V = 4.92). We show that we can successfully decompose the field in amplitude and phase and reconstruct this observed field with very high fidelity.

Main supervisor (name and email)<br>and his / her institution

Prof Andrew Forbes
AForbes1@csir.co.za
CSIR - National Laser Center; University of Stellenbosch; UKZN

Level for award<br>&nbsp;(Hons, MSc, <br> &nbsp; PhD)?

PhD

Would you like to <br> submit a short paper <br> for the Conference <br> Proceedings (Yes / No)?

No

Primary author

Mr Darryl Naidoo (Council for Scientific and Industrial Research)

Co-authors

Mr Andrew Forbes (Council for Scientific and Industrial Research) Mr Christian Schulze (Institute of Applied Optics, Friedrich Schiller University) Mr Daniel Flamm (Institute of Applied Optics, Friedrich Schiller University) Dr Michael Duparré (Institute of Applied Optics, Friedrich Schiller University)

Presentation Materials

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