Speaker
Mr
Macdufe Mkabela
(National Metrology Institution of South Africa)
Description
This presentation addresses sources of uncertainties in an ultraviolet (UV) spectroradiometry setup for measuring spectral irradiance. In UV spectroradiometry, spectral irradiance measurements have high uncertainties mainly due to a low signal-to-noise ratio (SNR) in the UV region; however other factors may also contribute to high uncertainties. Therefore determining the sources of uncertainties is important to improve the accuracy of the measured results. We perform characterization of the UV spectroradiometric setup to quantify certain sources of uncertainty in measurement associated with this setup. These include positioning and alignment of sources, scattered light, and the system temperature dependence.
Level for award<br> (Hons, MSc, <br> PhD, N/A)?
MSc
Main supervisor (name and email)<br>and his / her institution
Walter Meyer
wmeyer@up.ac.za
University of Pretoria
Private bag X20
Hartfield
0028
Would you like to <br> submit a short paper <br> for the Conference <br> Proceedings (Yes / No)?
yes
Apply to be<br> considered for a student <br> award (Yes / No)?
yes
Primary author
Mr
Macdufe Mkabela
(National Metrology Institution of South Africa)
Co-authors
Mr
Pieter Du Toit
(NMISA)
Mr
Rheinhardt Sieberhagen
(NMISA)
