4-8 July 2016
Kramer Law building
Africa/Johannesburg timezone
<a href="http://events.saip.org.za/internalPage.py?pageId=10&confId=86">The Proceedings of SAIP2016</a> published on 24 December 2017

Optical and electronic properties of silicon nanowires fabricated by Metal Assisted Chemical Ecthing

6 Jul 2016, 11:30
20m
LT1 (Kramer Law building)

LT1

Kramer Law building

UCT Middle Campus Cape Town
Oral Presentation Track A - Division for Physics of Condensed Matter and Materials Division for Physics of Condensed Matter and Materials (1)

Speaker

Mr Sfiso khanyile (Author)

Level for award<br>&nbsp;(Hons, MSc, <br> &nbsp; PhD, N/A)?

PhD

Main supervisor (name and email)<br>and his / her institution

Prof. Christopher Arendse

Please indicate whether<br>this abstract may be<br>published online<br>(Yes / No)

Yes

Abstract content <br> &nbsp; (Max 300 words)<br><a href="http://events.saip.org.za/getFile.py/access?resId=0&materialId=0&confId=34" target="_blank">Formatting &<br>Special chars</a>

Silicon nanowires are promising materials for use in low cost solar cell applications due to their high surface area, efficient light trapping and high carrier mobilities. In this paper, we report on the fabrication of silicon nanowires using the metal assisted chemical etching method for different etching durations and the doping of these intrinsic Si NWs with POCl3. Scanning electron microscopy revealed the correlation between the etching time and the morphological properties such as length of the as-grown Si NWs. The Si NWs were found to have diameters ranging from about 80 nm to 200 nm and their lengths ranging from about 1 μm to 4 μm. High resolution transmission electron microscopy investigation showed that the SiNWs had a crystalline core and amorphous silicon oxide shell structure with some Si nanocrystals embedded in it. The doped Si NWs exhibited very strong photoluminescence bands, namely the blue and yellow-orange emission bands which were attributed to the formation of Si nanocrystals embedded in a SiO2 matrix and some structural defects. The UV-Vis specular reflection measurements conducted on the Si NWs displayed enhanced anti-reflective properties with reflection dropping below 2 %. Hall-effect measurements also showed improved conductivity of the doped Si NWs compared to the intrinsic Si NWs.

Apply to be<br> considered for a student <br> &nbsp; award (Yes / No)?

Yes

Would you like to <br> submit a short paper <br> for the Conference <br> Proceedings (Yes / No)?

Yes

Primary author

Mr Sfiso khanyile (Author)

Co-authors

Prof. Christopher Arendse (Supervisor) Dr Clive Oliphant (Co supervisor)

Presentation Materials

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