9-13 July 2012
Africa/Johannesburg timezone
<a href="http://events.saip.org.za/internalPage.py?pageId=11&confId=14"><font color=#ff0000>SAIP2012 PROCEEDINGS AVAILABLE</font></a>

Defect identification in FeTiO<sub>3</sub> using positron annihilation technique

10 Jul 2012, 17:30
IT Building

IT Building

Poster Presentation Track A - Division for Condensed Matter Physics and Materials Poster Session


Mr Thulani Jili (University of Zululand)

Abstract content <br> &nbsp; (Max 300 words)

Positron lifetime measurements are conducted in ilmenite material with hexagonal structure, in the temperature range from 30 K to 500 K. The analysis of the positron lifetime spectra is best fitted to two lifetime components. The positron lifetime in the bulk ranges from 177 ps to 186 ps in the temperature range for defect-free region. The second lifetime components of localized positrons range from 350 ps to 462 ps in the temperature range. The second lifetime components are attributed to the positron trapping at structural vacancies. A close analysis of second lifetime components and the fact that the annihilation ratios are greater than 1.4 suggest a formation of vacancy clusters in the temperature range from 250 K to 500 K.

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Primary author

Mr Thulani Jili (University of Zululand)


Dr Daniel Wamwangi (University of the Witwatersrand) Prof. Elias Sideras-Haddad (University of the Witwatersrand) Dr Filip Tuomisto (Aalto University) Dr Lukasz Kilanski (Polish Academy of Sciences)

Presentation Materials

Peer reviewing