9-13 July 2012
Africa/Johannesburg timezone
<a href="http://events.saip.org.za/internalPage.py?pageId=11&confId=14"><font color=#ff0000>SAIP2012 PROCEEDINGS AVAILABLE</font></a>

Structural, Electrical and Electronic Properties of carbon and carbon-based materials

10 Jul 2012, 17:30
2h
IT Building

IT Building

Poster Presentation Track A - Division for Condensed Matter Physics and Materials Poster Session

Speaker

Mr Wilfred mbiombi (Wits)

Apply to be<br> consider for a student <br> &nbsp; award (Yes / No)?

No

Level for award<br>&nbsp;(Hons, MSc, <br> &nbsp; PhD)?

N/A

Main supervisor (name and email)<br>and his / her institution

Sekhar C. Ray, Sekhar.Ray@wits.ac.za

Would you like to <br> submit a short paper <br> for the Conference <br> Proceedings (Yes / No)?

No

Abstract content <br> &nbsp; (Max 300 words)

Wilfred Mbiombi, Zivayi Chiguvare, Daniel Wamwangi and Sekhar C. Ray*
School of Physics, DST/NRF Centre of Excellence in Strong Materials and Materials Physics Research Institute (MPRI); University of the Witwatersrand, Pvt. Bag 3, WITS 2050, Johannesburg, South Africa

In this work, we have studied the structural, electronic and electrical properties of diamond like carbon (DLC: a-C:H), silicon doped-DLC (a-C:H:Si) and nitrogen-doped amorphous carbon (a-CNx) thin films grown by plasma enhanced chemical vapour deposition (PECVD) process. Un-doped DLC films were prepared at different applied bias voltage (Vb ) starting from 100 V to 600 V, whereas the silicon is doped using tetramethysilane (TMS) as a precursor at different SSCM and N is doped a-CNx films were prepared at different at% N using nitrogen precursors. The thicknesses of all thin films are ~150 nm. Micro-structure and electronic properties were studied using Raman spectroscopy; whereas electrical properties were studied using voltage (V) vs current (I) measurements. It is found that the electrical conductivity is strongly responsible to the presence of sp2-hybridized carbon atoms in the thin films structure. We have obtained the (ID/IG) ratio of all thin films from Raman spectra and are correlated with the electrical conductivity.

  • Corresponding Author: Sekhar.Ray@wits.ac.za (Sekhar C. Ray), Ph: +27-011-7176806

Primary author

Co-authors

Dr Daniel Wamwangi (Wits University) Dr Zivayi Chiguvare (Wits University)

Presentation Materials

There are no materials yet.