9-13 July 2012
Africa/Johannesburg timezone
<a href="http://events.saip.org.za/internalPage.py?pageId=11&confId=14"><font color=#ff0000>SAIP2012 PROCEEDINGS AVAILABLE</font></a>

Stability of high temperature operating Ru-SiC Schottky diodes using 6H-SiC as a substrate, and nickel as an ohmic contact

13 Jul 2012, 08:40
20m
Oral Presentation Track F - Applied Physics Applied Physics Forum

Speaker

Mr Kinnock Vundawaka Munthali (University of Pretoria and Polytechnic of Namibia)

Main supervisor (name and email)<br>and his / her institution

Prof Chris Theron, University of Pretoria
chris.theron@up.ac.za

Apply to be<br> consider for a student <br> &nbsp; award (Yes / No)?

Yes

Would you like to <br> submit a short paper <br> for the Conference <br> Proceedings (Yes / No)?

Yes

Level for award<br>&nbsp;(Hons, MSc, <br> &nbsp; PhD)?

PhD

Abstract content <br> &nbsp; (Max 300 words)

High temperature operating Ru-SiC Schottky diodes were successfully fabricated for the first time by using electron beam deposition of ruthenium on the n-type bulk-grown 6H-SiC samples. The nickel back ohmic contact was deposited on the SiC samples by resistive evaporation technique. The Schottky diodes showed excellent rectifying behaviour up to an annealing temperature of 900 °C. The Ru-SiC Schottky diode samples were annealed isochronally in argon at temperatures ranging from 100 -1000 °C. After each annealing temperature, full IV and CV characterisation was done. The Schottky barrier height (SBH) obtained through IV characteristics, and CV characteristics increased from 0.58 eV, and 1.83 eV respectively for the as-deposited sample to 0.86 eV, and 4.12 eV for the sample annealed at 900 °C. The ideality factor and reverse saturation current ranged from 1.047, and 1.22x10-5 A respectively for the as deposited to 3.05, and 3.85x10-11 A for the sample annealed at 900 °C. The SBH obtained from IV characterisation showed some slight variation at various annealing temperatures. The Schottky diodes showed very good linear CV characteristics and excellent forward IV characteristics with a forward voltage drop of 1.5 V up to an annealing temperature of 900 °C, and then degraded after this temperature.

Primary author

Mr Kinnock Vundawaka Munthali (University of Pretoria and Polytechnic of Namibia)

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