SAIP2012

AFM and SEM studies on iodine implanted 6H-SiC

12 Jul 2012, 17:30

2h

IT Building

Poster Presentation Track A - Division for Condensed Matter Physics and Materials Poster Session

Speaker

Mr Remeredzai Joseph Kuhudzai (University of Pretoria)

Apply to be<br> consider for a student <br> &nbsp; award (Yes / No)?

Yes

Would you like to <br> submit a short paper <br> for the Conference <br> Proceedings (Yes / No)?

No

Level for award<br>&nbsp;(Hons, MSc, <br> &nbsp; PhD)?

PhD

Main supervisor (name and email)<br>and his / her institution

Prof JB Malherbe
johan.malherbe@up.ac.za
University of Pretoria

Abstract content <br> &nbsp; (Max 300 words)

The study of ion beam modification of surfaces has increasingly become an integral part of characterising silicon carbide and related nuclear materials. The effect of a relatively high fluence (2 x 10^{17 127}I⁺ ions) of iodine on the surface of 6H-SiC has been investigated. The contribution of vacuum annealing to the evolution of the surface morphology was also studied. Isochronal vacuum annealing was perfomed at temperetures ranging from 350 °C to 1200 °C. Atomic force microscopy (AFM) and high resolution scanning electron microscopy (FEG SEM) were employed to analyse the surface microstructure.