9-13 July 2012
Africa/Johannesburg timezone
<a href="http://events.saip.org.za/internalPage.py?pageId=11&confId=14"><font color=#ff0000>SAIP2012 PROCEEDINGS AVAILABLE</font></a>

Towards Quantification of Cu and Ni Using X-Ray Radiography

10 Jul 2012, 12:00
Poster Presentation Track F - Applied Physics Applied Physics Forum


Mr Lunga Bam (Necsa)

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Abstract content <br> &nbsp; (Max 300 words)

The correction of measured transmitted intensity (X-Rays) is important in radiography for quantification of elements. The produced polychromatic beam (tungsten spectrum) makes it difficult to quantify elements with respect to quantitative measurement. The transmitted beam through the sample will give a range of attenuation coefficients due to its polychromatic nature at the specific energy. Therefore a new method of Ratio Application has been developed to correct the measured transmitted intensity to obtain experimental attenuation coefficient that corresponds with theoretical attenuation coefficient. This correction has been applied to thin sheets of Cu and Ni samples at 100keV and 150keV (spectrum energy) and results will be presented. The purpose of this study is to eventually be able to identify small quantity of elements within the parent matrix.

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Primary author

Mr Lunga Bam (Necsa)

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