Speaker
Mr
Mahjoub Ismail
(Postgradiuate student)
Description
Recently, there has been a renewed interest in employing glassy carbonto contain radioactive fission products. Oneof the fission products, Xe is significant by itself due to its high neutron absorption crosssection and high production as a fission product. 200 keV Xenon (Xe) ions were implanted in the glassy carbon samples to a fluence of 1 × 10^16 Xe+ cm-2 at room temperature. The diffusion of the implanted Xenon in the glassy carbon was measured using Rutherford backscattering (RBS) after vacuum annealing. The surface topography of the samples before and after each annealing temperature was investigated using scanning electron microscopy (SEM).
Would you like to <br> submit a short paper <br> for the Conference <br> Proceedings (Yes / No)?
Yes
Level for award<br> (Hons, MSc, <br> PhD, N/A)?
PhD
Apply to be<br> considered for a student <br> award (Yes / No)?
Yes
Main supervisor (name and email)<br>and his / her institution
Johan Malherbe
Johan.Malherbe@up.ac.za
University of Pretoria
Primary author
Mr
Mahjoub Ismail
(Postgradiuate student)
Co-authors
Prof.
Johan Malherbe
(UP staff)
Dr
Thulani Hlatshwayo
(UP staff)
