Speaker
Mr
Shane Smith
(Laser Research Institute, University of Stellenbosch)
Description
Ellipsometry is a spectroscopic technique with which one can obtain both the refractive index and absorption coefficient of a sample by measuring the polarization resolved light reflected from it. This is especially useful in situations where making use of a reference sample is unwanted. Terahertz time-domain spectroscopy is a powerful spectroscopic tool, but terahertz radiation is strongly absorbed by water. Thus, it is near impossible to analyse a sample in an aqueous solution, or any other material that is optically dense to terahertz radiation, in transmission. To examine such samples, it would be preferable to work in reflection, but conventional reflection setups in the terahertz region are very difficult to construct due to the accuracy required in the positioning of a reference sample relative to the sample of interest. To circumvent this problem, we constructed a terahertz ellipsometer. On this poster, we will be discussing the basics of ellipsometry and its implementation in conjunction with terahertz time-domain spectroscopy.
Summary
On this poster, we will be discussing the basics of ellipsometry and its implementation in conjunction with terahertz time-domain spectroscopy.
Level for award<br> (Hons, MSc, <br> PhD, N/A)?
PhD
Apply to be<br> considered for a student <br> award (Yes / No)?
Yes
Would you like to <br> submit a short paper <br> for the Conference <br> Proceedings (Yes / No)?
No
Main supervisor (name and email)<br>and his / her institution
Pieter Neethling
pietern@sun.ac.za
Stellenbosch University - Physics Department
Laser Research institute
Primary author
Mr
Shane Smith
(Laser Research Institute, University of Stellenbosch)
Co-authors
Prof.
Erich Rohwer
(University of Stellenbosch)
Dr
Pieter Neethling
(Laser Research Institute, University of Stellenbosch)
