Speaker
Mr
Musawenkosi Khulu
(University of Zululand)
Description
ZnO (wurtzite) samples were implanted with Ar+ ions to generate intrinsic defects within the samples for fluencies ranging from 10^4 to 10^18 per cm. Doppler broadening of the annihilation centroids were obtained to determine S- and W - parameters which are associated with a quantity of defects. X-ray diffraction (XRD) method was employed to determine any structural or phase change associated with Ar+ implantation. The positron annihilation spectroscopy results were correlated with Optical absorption spectra of the crystals to investigate various bands at different fluencies.
Apply to be considered for a student ; award (Yes / No)?
Yes
Level for award;(Hons, MSc, PhD, N/A)?
MSc
Primary authors
Mr
Musawenkosi Khulu
(University of Zululand)
Thulani Jili
(University of Zululand)
Morgan Madhuku
(iThemba LABS)
Cebo Ndlangamandla
(University of Zululand)
