Speaker
Prof.
Hitoshi Abe
(Photon Factory (PF), Institute of Materials Structure Science (IMSS), High Energy Accelerator Research Organization (KEK))
Description
X-ray Absorption Fine Structure (XAFS) is one of the most widely used methods at synchrotron facilities. XAFS is a suitable nondestructive method to observe chemical states elements and local structures around elements of interest in not only crystalline or solid but also amorphous or liquid samples. From a crystallographic point of view, If we have crystalline samples, it's good to perform XRD experiments to obtain information on crystal structures. When we are, however, interested in local structures of a certain element in a sample, XAFS can be a powerful tool. In other words, XAFS can provide complementary information to XRD.
We would like to share some XAFS studies.
Primary author
Prof.
Hitoshi Abe
(Photon Factory (PF), Institute of Materials Structure Science (IMSS), High Energy Accelerator Research Organization (KEK))
