Speaker
Prof.
Diouma Kobor
(University Assane Seck of Ziguinchor)
Description
PZN-PT single crystals showed properties up to 10 times more interesting than
those of the ferroelectric perovskite materials currently used. However, the
greatest difficulty to use PZN-4.5PT single crystals on electronic devices is to
achieve them in thin layers form because of their incongruent melting property.
In this work we fabricate with success thin films by dispersing these
nanoparticles in a gel. The as fabricated thin films showed colossal dielectric
permittivity large than 105. However, we found from SEM images the formation
of non-identified hexagonal microcrystals, which could be the origin of such
excellent properties. These require intensive investigations to identify such
hexagonal components and the phase changes in dielectric-temperature
characteristic.
Synchrotron light source was used to characterize the influence of manganese
doping on the single crystals using XANES spectroscopy at ESRF. Philips X’Pert
Pro XRD diffractometer was used to identify the hexagonal microcrystals and the
phase changes using temperature chamber coupled to the diffractometer.
Primary author
Prof.
Diouma Kobor
(University Assane Seck of Ziguinchor)
