Speaker
Ms
Ingrid Segola
(Tshwane University of Techonology/iThemba LABS)
Description
In this study, polyaniline thin films of various thicknesses on a silicon (Si) substrate were deposited by electrospinning polyaniline-emeraldine base (PANI (EB)) solution obtained by mixing PANI with the solvent DMSO (Di-methyl sulphur dioxide). Different thicknesses of the films were obtained by varying the spin coating time, while uniformity was investigated by varying spin coating speed. The constant flow of the solution was maintained at all times, resulting in the constant dropping of the solution on the substrate. Rutherford backscattering spectrometry (RBS) was used to determine the thickness and stoichiometry of the films for the different spin times and speeds. The crystal structure investigation was done using an X-ray diffractometer (XRD), while Fourier transmittance infrared spectroscopy (FTIR) was used to measure the consistency of the molecular structure and structural transformations of the thin films. UV-vis was used to measure the optical transmission of the thin films which resulted in the evaluation of band gap using Swanepoel's envelope method for different thicknesses.
Apply to be<br> considered for a student <br> award (Yes / No)?
Yes
Level for award<br> (Hons, MSc, <br> PhD, N/A)?
MSc
Primary author
Ms
Ingrid Segola
(Tshwane University of Techonology/iThemba LABS)
Co-authors
Dr
Christopher Mtshali
(iThemba LABS)
Dr
Mandla Msimanga
(Tshwane University of Technology)
