Speakers
Mr
Dakalo Mashamba
(Tshwane University of Technology)
Dr
Mandla Msimanga
(Tshwane University of Technology)
Description
Ion Beam Analysis is a suite of techniques used to determine elemental composition and depth profiles of thin film structures. The effectiveness of the analysis is expected to improve with the use of heavy ions due to higher cross sections (such as stopping force and X-ray production). In this project a comparison will be done between analysis with heavy ions and with light ions. The analysis is to be performed as part of the project aimed at developing polymer based nuclear radiation sensors. Several films of PANI were deposited on ITO coated PET substrates via spin coating. The films were then implanted to different doses using 100 keV Ti+ ions to form metal-polymer nanocomposites. RBS, PIXE and ERDA analyses were the carried out at iThemba LABS TAMS to confirm implant doses and depth profiles.
Level for award<br> (Hons, MSc, <br> PhD, N/A)?
Msc
Apply to be<br> considered for a student <br> award (Yes / No)?
Yes
Primary author
Mr
Dakalo Mashamba
(Tshwane University of Technology)
Co-authors
Dr
Mandla Msimanga
(Tshwane University of Technology)
Dr
Philip Dr P Sechogela
(ithemba LABS)
