25-29 June 2018
Africa/Johannesburg timezone
General information and Registration for SAIP2018 is handled by Eastern Sun Events at: http://www.saipconference.co.za/ <p> Deadline for papers for the conference proceedings is 28 July 2018

Microwave induced electron losses from an ECR Ion Source

28 Jun 2018, 12:40
20m
Oral Presentation Track B - Nuclear, Particle and Radiation Physics Nuclear, Particle and Radiation Physics

Speaker

Mr Muneer Sakildien (iThemba LABS)

Description

To enhance high charge state ion beam production it is imperative to maximize the electron confinement time of the heated electron populations of an Electron Cyclotron Resonance Ion Source (ECRIS). A key loss mechanism for heated electrons are induced by the injected microwaves which heats the plasma electrons of an ECRIS. This electron loss mechanism is thought to limit ultimate source performance. With this investigation a number of plasma diagnostics were combined to study this plasma process. Here we will report on the results of preliminary measurements on the JYFL 14 GHz ECRIS.

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Primary author

Mr Muneer Sakildien (iThemba LABS)

Co-author

Dr Pete Jones (iThemba LABS)

Presentation Materials

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