Speaker
Dr
Elena Tereschenko
(NRC Kurchatov Institute, Institute of Crystallography RAS)
Description
The grazing incidence x-ray standing wave technique (XSW) is widely used for thin layered structure investigation. It is based on simultaneous analysis of x-ray reflectivity and x-ray fluorescence yield modulated by standing wave field formed due to the interference of the incident and reflected beams. While the reflectivity is sensitive to general distribution of electron density the angular dependence of fluorescence yield is sensitive to the position of selected atom along the normal to the surface [1, 2].
In this report the XSW technique was used for the determine of the preferential molecular orientation in organic monolayers of porphyrin(Zn)-fullerene dyad ZnDHD6ee on the water surface and solid substrate [3], for the investigation of diffusion process in thin layered structures during the thermal quasicrystal film formation [4] and of the growth mechanisms in the Si–Ge heterostructures [5]. It is well-known that XSW is very promising to study of the planar systems different nature – organic, bioorganic and inorganic, including self-organizing macromolecule or lipid-protein systems on water surface [1]. This technique also can be used for “in vitro” study of transport, barrier and protective functions of cell-membrane model.
1. Zheludeva S.I., Novikova N.N., Kovalchuk M.V. et al. Series on Synchrotron Radiation Techniques and applications. Vol.7, 355-368 (2013)
2. Vartanyanz I.A., Kovalchuk M.V. Rep.Prog.Phys. 64, 1009-1084 (2001)
3. Seregin A.Yu., D'yakova Yu.A., Yakunin S.N. et al. Crystallography Reports 58(6), 934-938 (2013)
4. Seregin A.Yu., Makhotkin I.A.,•Yakunin S.N. et al. Crystallography Reports 56(3). 497-501 (2011)
5. Roddatis V.V., Yakunin S.N., Vasiliev A.L. et al. Journal of Materials Research 28(11), 1432-1441 (2013)
Primary author
Dr
Elena Tereschenko
(NRC Kurchatov Institute, Institute of Crystallography RAS)
Co-authors
Dr
Alexey Seregin
(NRC "Kurchatov Institute", Institute of Crystallography RAS)
Prof.
Mikhail Kovalchuk
(NRC Kurchatov Institute, Institute of Crystallography RAS)
Dr
Sergey Yakunin
(NRC Kurchatov Institute)
