28 June 2015 to 3 July 2015
Africa/Johannesburg timezone
SAIP2015 Proceeding published on 17 July 2016

High resolution X-ray diffraction and photoluminescence of InAs<sub>1-x</sub>Sb<sub>x</sub>/GaSb

30 Jun 2015, 16:10
1h 50m
Board: A.283
Poster Presentation Track A - Division for Physics of Condensed Matter and Materials Poster1

Speaker

Mr Stephen Dobson (NMMU)

Apply to be<br> considered for a student <br> &nbsp; award (Yes / No)?

No

Level for award<br>&nbsp;(Hons, MSc, <br> &nbsp; PhD, N/A)?

PhD

Would you like to <br> submit a short paper <br> for the Conference <br> Proceedings (Yes / No)?

No

Please indicate whether<br>this abstract may be<br>published online<br>(Yes / No)

Yes

Abstract content <br> &nbsp; (Max 300 words)<br><a href="http://events.saip.org.za/getFile.py/access?resId=0&materialId=0&confId=34" target="_blank">Formatting &<br>Special chars</a>

InAs1-xSbx has the lowest energy band gap among all the III-V semiconductors and has thus received a great deal of attention as an important material to be incorporated into infrared optoelectronic devices. Photodetectors containing this ternary have potential to reach wavelengths up to 9 µm. To achieve this, high quality thin films with few defects and impurities are required. One of the key issues in using InAs1-xSbx in the device architecture (particularly for wavelengths greater than 4 µm) is the lack of available lattice-matched substrates. To date, the best performing InAsSb-containing devices are lattice matched to GaSb substrates, with a 9% antimony solid content. (i.e. InAs0.91Sb0.09).

This paper focuses on the deposition of high quality thin films of InAs0.91Sb0.09 (between 2 µm and 4 µm thick) on 2″ GaSb substrate. The material deposition is performed in a metal organic chemical vapour deposition (MOCVD) system. The process begins by the deposition of a thin (nanometer thickness range) low temperature buffer layer of either GaSb followed by the deposition of strain free InAsSb. High resolution X-ray diffraction (HRXRD) is used to precisely determine the composition of the ternary alloy as well as to investigate the uniformity across the entire wafer. Photoluminescence (PL), using a Fourier-transform infrared (FTIR) spectrometer, is employed to further explore the material quality and purity. Preliminary measurements indicate consistent thickness and compositional uniformity of the InAsSb layers.

Main supervisor (name and email)<br>and his / her institution

Prof JR Botha
Reinhardt.Botha@nmmu.ac.za
NMMU

Primary author

Co-authors

Prof. Johannes Reinhardt Botha (NMMU) Prof. Magnus Wagener (NMMU) Dr Viera Wagener (Nelson Mandela Metropolitan University)

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