8-12 July 2013
Africa/Johannesburg timezone
<a href="http://events.saip.org.za/internalPage.py?pageId=13&confId=32"><font color=#ff0000>SAIP2013 PROCEEDINGS AVAILABLE</font></a>

Structural studies of Y and Zr doped nano-crystalline tin oxide using EXAFS and Raman Scattering techniques.

9 Jul 2013, 17:40
1h
Poster Presentation Track A - Division for Condensed Matter Physics and Materials Poster1

Speaker

Prof. Erasmus Koena Rammutla (University of Limpopo)

Abstract content <br> &nbsp; (Max 300 words)

Nanocrystals of Y and Zr doped SnO2 have been prepared by sol-gel route and annealed at 200, 400, 600, 800 and 1000 0C. The X-ray diffraction (XRD) results showed the average size of the particles in the freshly prepared samples to be ~ 3 nm. The Extended Absorption Fine Structure (EXAFS) technique was used to study the dopant environments in nanocrystalline tin oxide. In all Y-doped samples, except the one annealed at 1000 0C, there is clear evidence that Y has not entered the SnO2 lattice. This is clearly supported by the Raman scattering results. In all Zr-doped samples, there is a simple substitution for Sn by Zr.

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Primary author

Prof. Erasmus Koena Rammutla (University of Limpopo)

Co-authors

Prof. AV Chadwick (University of Kent, School of Physical Sciences, Canterbury, UK) Dr RM Erasmus (University of the Witwatersrand, School of Physics, Johannesburg, 2050, RSA)

Presentation Materials

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