SAIP2010

Quantitative Investigation of Cu/In thin Films Deposited onto SiO2 by Electron Beam Evaporation

Not scheduled

CSIR Convention Centre

Poster Track A - Condensed Matter Physics and Material Science

Speaker

Mr Moshawe Maditi (UFS)

Description

Thin In/Cu films were grown on a SiO2 substrate. Both In and Cu layers were grown by e-beam evaporation. The films were characterized with X-ray Diffraction (XRD) and Auger Electron Spectroscopy (AES). The In diffused into the Cu layer during evaporation and formed two intermetallic Cu11In9 and CuIn2 phases.