27 September 2010 to 1 October 2010
CSIR Convention Centre
Africa/Johannesburg timezone

Quantitative Investigation of Cu/In thin Films Deposited onto SiO2 by Electron Beam Evaporation

Not scheduled
CSIR Convention Centre

CSIR Convention Centre

CSIR, Pretoria
Poster Track A - Condensed Matter Physics and Material Science


Mr Moshawe Maditi (UFS)


Thin In/Cu films were grown on a SiO2 substrate. Both In and Cu layers were grown by e-beam evaporation. The films were characterized with X-ray Diffraction (XRD) and Auger Electron Spectroscopy (AES). The In diffused into the Cu layer during evaporation and formed two intermetallic Cu11In9 and CuIn2 phases.

Primary author


Prof. HC Swart (UFS) Prof. JJ Terblans (UFS)

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