27 September 2010 to 1 October 2010
CSIR Convention Centre
Africa/Johannesburg timezone

Thin film analysis by Time of Flight– Elastic Recoil Detection

Not scheduled
CSIR Convention Centre

CSIR Convention Centre

CSIR, Pretoria
Presentation Track A - Condensed Matter Physics and Material Science


Mr Mandla Msimanga (iThemba LABS)


Heavy Ion - Elastic Recoil Detection (HI-ERD) analysis is now a well established ion beam technique in the analysis of thin film materials of technological and medical importance. It is to a large extent the most suitable nuclear analytical technique available for simultaneous identification and quantitative depth profiling of light elements in thin films. This presentation describes a Time of Flight (ToF) spectrometer designed and assembled for Heavy Ion - ERD analysis at iThemba LABS and first analysis results thereof.

Primary author

Mr Mandla Msimanga (iThemba LABS)


Prof. Carlos Pineda-Vargas (iThemba LABS) Prof. Craig Comrie (University of Cape Town) Mr Sean Murray (iThemba LABS)

Presentation Materials

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