Speaker
Mr
Mandla Msimanga
(iThemba LABS)
Description
Heavy Ion - Elastic Recoil Detection (HI-ERD) analysis is now a well established ion beam technique in the analysis of thin film materials of technological and medical importance. It is to a large extent the most suitable nuclear analytical technique available for simultaneous identification and quantitative depth profiling of light elements in thin films. This presentation describes a Time of Flight (ToF) spectrometer designed and assembled for Heavy Ion - ERD analysis at iThemba LABS and first analysis results thereof.
Primary author
Mr
Mandla Msimanga
(iThemba LABS)
Co-authors
Prof.
Carlos Pineda-Vargas
(iThemba LABS)
Prof.
Craig Comrie
(University of Cape Town)
Mr
Sean Murray
(iThemba LABS)
