27 September 2010 to 1 October 2010
CSIR Convention Centre
Africa/Johannesburg timezone

Variation of device parameters of multi-crystalline silicon at defect regions

Not scheduled
CSIR Convention Centre

CSIR Convention Centre

CSIR, Pretoria
Presentation Track F - Applied and Industrial Physics


Mr Mathew Munji (Nelson Mandela Metropolitan University)


A Solar-Light Beam Induced Current measurement system was used to identify defects regions in a multi-crystalline silicon cell. A particle swarm optimization algorithm was used to extract device parameters from current-voltage data to determine the variation of the device parameters of the cell at the defect locations.

Primary author

Mr Mathew Munji (Nelson Mandela Metropolitan University)


Prof. E.E. van Dyk (Nelson Mandela Metropolitan University) Dr Frederik Vorster (Nelson Mandela Metropolitan University) Dr Willy Okullo (Nelson Mandela Metropolitan University)

Presentation Materials

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