Speaker
Prof.
JAPIE ENGELBRECHT
(NMMU)
Description
The influence of dielectric parameters involved in the simulation of the reflectivity in the reststrahlen region of SiC is investigated as a possible cause for the appearance of an anomalous peak in this region of the reflectance spectrum of SiC. Results will be presented and discussed.
Primary author
Prof.
JAPIE ENGELBRECHT
(NMMU)
Co-author
Isabel Van Rooyen
(PBMR Company)
