Prof.
Purushottam Chakraborty
07/07/2023, 08:40
Track H - Plenaries
Oral Presentation
Continuous progress in the understanding of fundamental and instrumental aspects of Secondary Ion Mass Spectrometry (SIMS) has made this technique extremely powerful for the analysis of materials. Secondary ion-emission is a complex phenomenon and amongst various mechanisms, the ‘electron-tunnelling model’ based on the survival probability of an escaping ion above the surface is the widely...
