9-13 July 2012
Segregation measurements of In and S on a Cu(In,S) ternary alloy using Auger Electron Spectroscopy coupled with a linear programmed heater
Presented by Mr. Moshawe MADITO on 12 Jul 2012 from 14:50 to 15:10
Type: Oral Presentation
Track: Track A - Division for Condensed Matter Physics and Materials
Segregation is playing a very significant role during heat treatments to engineer the composition and properties of grain boundaries and surfaces of a crystal . There is large number of segregation studies on the segregation of impurities form Cu [2–6]. Despite the considerable number of publication concerning segregation of impurities from a Cu crystal, no study was found for In segregating from a Cu crystal. Therefore, this study is most likely the first to report on the segregation of In from a Cu crystal. In this study a dilute Cu(In,S) ternary alloy was prepared by diffusion doping. The segregation behaviour of In and S was measured using Auger Electron Spectroscopy (AES) coupled with a linear programmed heater. From the measured segregation profiles it was found that the In segregated first followed by S. The S completely replaced the In from the surface indicating that S has as larger segregation energy than In. From the segregation profiles the segregation parameters, namely the pre-exponential factor (D0), the activation energy (Q), the interaction energies (Ω) and the segregation energies (∆G) were extracted with the modified Darken model for In (D0 = 2.2 ± 0.5 × 10-5 m2 s-1, Q = 184.3 ± 1.0 kJ mol-1, ∆G = −62.8 ± 1.4 kJ mol-1, ΩCu−In = 3.0 ± 0.4 kJ mol-1) and S (D0 = 8.8 ± 0.5 × 10-3 m2 s-1, Q = 213.0 ± 3.0 kJ mol-1, ∆G = −120.0 ± 3.5 kJ mol-1, ΩCu−S = 23.0 ± 2.0 kJ mol-1). The interaction energy for In and S was ΩIn−S = −4.0 ± 0.5 kJ mol-1. References N.H. Heo, Metals and Materials, 2 (1) (1996) 49. E.C. Viljoen and J. du Plessis, Surface and Interface Analysis, 22 (1994) 598. E.C. Viljoen and J. du Plessis, Surface and Interface Analysis, 23 (1995) 110. J.J. Terblans. and G. N. van Wyk, Surface and Interface Analysis, 36 (2004) 935. J.Y. Wang, J. du Plessis, J.J. Terblans and G.N. vanWyk, Surface Science, 423 (1999) 12. J.J. Terblans, H.C. Swart, e-Journal of Surface Science and Nanotechnology, 7 (2009) 480.
firstname.lastname@example.org (Prof. Terblans)