9-13 July 2012
Africa/Johannesburg timezone
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Segregation measurements of In and S on a Cu(In,S) ternary alloy using Auger Electron Spectroscopy coupled with a linear programmed heater

Presented by Mr. Moshawe MADITO on 12 Jul 2012 from 14:50 to 15:10
Type: Oral Presentation
Session: DCMPM2
Track: Track A - Division for Condensed Matter Physics and Materials

Abstract

Segregation is playing a very significant role during heat treatments to engineer the composition and properties of grain boundaries and surfaces of a crystal [1]. There is large number of segregation studies on the segregation of impurities form Cu [2–6]. Despite the considerable number of publication concerning segregation of impurities from a Cu crystal, no study was found for In segregating from a Cu crystal. Therefore, this study is most likely the first to report on the segregation of In from a Cu crystal. In this study a dilute Cu(In,S) ternary alloy was prepared by diffusion doping. The segregation behaviour of In and S was measured using Auger Electron Spectroscopy (AES) coupled with a linear programmed heater. From the measured segregation profiles it was found that the In segregated first followed by S. The S completely replaced the In from the surface indicating that S has as larger segregation energy than In. From the segregation profiles the segregation parameters, namely the pre-exponential factor (D0), the activation energy (Q), the interaction energies (Ω) and the segregation energies (∆G) were extracted with the modified Darken model for In (D0 = 2.2 ± 0.5 × 10-5 m2 s-1, Q = 184.3 ± 1.0 kJ mol-1, ∆G = −62.8 ± 1.4 kJ mol-1, ΩCu−In = 3.0 ± 0.4 kJ mol-1) and S (D0 = 8.8 ± 0.5 × 10-3 m2 s-1, Q = 213.0 ± 3.0 kJ mol-1, ∆G = −120.0 ± 3.5 kJ mol-1, ΩCu−S = 23.0 ± 2.0 kJ mol-1). The interaction energy for In and S was ΩIn−S = −4.0 ± 0.5 kJ mol-1. References [1]N.H. Heo, Metals and Materials, 2 (1) (1996) 49. [2]E.C. Viljoen and J. du Plessis, Surface and Interface Analysis, 22 (1994) 598. [3]E.C. Viljoen and J. du Plessis, Surface and Interface Analysis, 23 (1995) 110. [4]J.J. Terblans. and G. N. van Wyk, Surface and Interface Analysis, 36 (2004) 935. [5]J.Y. Wang, J. du Plessis, J.J. Terblans and G.N. vanWyk, Surface Science, 423 (1999) 12. [6]J.J. Terblans, H.C. Swart, e-Journal of Surface Science and Nanotechnology, 7 (2009) 480.

Award

No

Level

PhD

Supervisor

terblansjj@ufs.ac.za (Prof. Terblans)

Paper

Yes

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