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SUMMARY:Evaluation of sputtering-induced surface roughness of polycrystall
 ine Ni/Cu multilayers thin films with AES and ToF-SIMS depth profiling
DTSTART;VALUE=DATE-TIME:20160705T091000Z
DTEND;VALUE=DATE-TIME:20160705T093000Z
DTSTAMP;VALUE=DATE-TIME:20261012T182828Z
UID:indico-contribution-5847@events.saip.org.za
DESCRIPTION:Speakers: XinLiang Yan (University of the Free State)\nhttps:/
 /events.saip.org.za/event/86/contributions/5847/
LOCATION:Kramer Law building LT1
URL:https://events.saip.org.za/event/86/contributions/5847/
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