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VERSION:2.0
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SUMMARY:Effect of thermal annealing on the electrical characteristics of A
 u/Ni Schottky contacts on high doped n-type 4H-SiC
DTSTART;VALUE=DATE-TIME:20160708T095000Z
DTEND;VALUE=DATE-TIME:20160708T101000Z
DTSTAMP;VALUE=DATE-TIME:20261012T185851Z
UID:indico-contribution-5663@events.saip.org.za
DESCRIPTION:Speakers: Ezekiel Omotoso (University of Pretoria)\nhttps://ev
 ents.saip.org.za/event/86/contributions/5663/
LOCATION:Kramer Law building 4B
URL:https://events.saip.org.za/event/86/contributions/5663/
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