SAIP2015

XRD and AFM studies of graphene and single-walled carbon nano tube

30 Jun 2015, 16:10

1h 50m

Board: A.097

Poster Presentation Track A - Division for Physics of Condensed Matter and Materials Poster1

Speaker

Ms Moshibudi Shai (University of limpopo)

Main supervisor (name and email)<br>and his / her institution

Thuto Mosuang, thuto.mosuang@ul.ac

Please indicate whether<br>this abstract may be<br>published online<br>(Yes / No)

yes

Level for award<br>&nbsp;(Hons, MSc, <br> &nbsp; PhD, N/A)?

MSC

Would you like to <br> submit a short paper <br> for the Conference <br> Proceedings (Yes / No)?

yes

Apply to be<br> considered for a student <br> &nbsp; award (Yes / No)?

No

Abstract content <br> &nbsp; (Max 300 words)<br><a href="http://events.saip.org.za/getFile.py/access?resId=0&materialId=0&confId=34" target="_blank">Formatting &<br>Special chars</a>

Graphene and single-walled carbon nanotubes were studied using X-ray diffraction (XRD) and atomic force microscopy (AFM). The lattice constants for both materials were determined and agree well with our computational calculation results. When preparing carbon nanotubes for AFM characterization, three solvents chloroform, toluene and ethanol were used. Chloroform was found to be the best solvent. The diameter of single-walled carbon nanotubes were determined and agree well with literature.