Speaker
Mr
Mathew Munji
(Nelson Mandela Metropolitan University)
Description
A Solar-Light Beam Induced Current measurement system was used to identify defects regions in a multi-crystalline silicon cell. A particle swarm optimization algorithm was used to extract device parameters from current-voltage data to determine the variation of the device parameters of the cell at the defect locations.
Primary author
Mr
Mathew Munji
(Nelson Mandela Metropolitan University)
Co-authors
Prof.
E.E. van Dyk
(Nelson Mandela Metropolitan University)
Dr
Frederik Vorster
(Nelson Mandela Metropolitan University)
Dr
Willy Okullo
(Nelson Mandela Metropolitan University)
