9-13 July 2012
Modification of glassy carbon under strontium ion implantation
Presented by Ms. opeyemi ODUTEMOWO on 10 Jul 2012 from 17:30 to 19:30
Type: Poster Presentation
Session: Poster Session
Track: Track A - Division for Condensed Matter Physics and Materials
The structural changes of glassy carbon (Sigradur® G) due to implantation with 360 keV strontium ions at room and high temperatures are reported. The samples were implanted with strontium ions at a fluence of 2×10<sup>16</sup> ions/cm<sup>2</sup> at room temperatures, 350 °C and 600 °C. The influence of ion implantation on surface morphology and topology was examined by the scanning electron microscopy (SEM) and atomic force microscope (AFM). Raman spectroscopy and X-ray diffraction were used to monitor the structural changes induced in glassy carbon as a result of implantation. The depth profiles of the strontium implanted at different temperatures we determined by Rutherford backscattering (RBS).
Prof J.B Malherbe firstname.lastname@example.org University of Pretoria