8-12 July 2013
Structural studies of Y and Zr doped nano-crystalline tin oxide using EXAFS and Raman Scattering techniques.
Presented by Prof. Erasmus Koena RAMMUTLA on 9 Jul 2013 from 17:40 to 18:40
Type: Poster Presentation
Track: Track A - Division for Condensed Matter Physics and Materials
Nanocrystals of Y and Zr doped SnO2 have been prepared by sol-gel route and annealed at 200, 400, 600, 800 and 1000 0C. The X-ray diffraction (XRD) results showed the average size of the particles in the freshly prepared samples to be ~ 3 nm. The Extended Absorption Fine Structure (EXAFS) technique was used to study the dopant environments in nanocrystalline tin oxide. In all Y-doped samples, except the one annealed at 1000 0C, there is clear evidence that Y has not entered the SnO2 lattice. This is clearly supported by the Raman scattering results. In all Zr-doped samples, there is a simple substitution for Sn by Zr.