8-12 July 2013
Africa/Johannesburg timezone
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Structural studies of Y and Zr doped nano-crystalline tin oxide using EXAFS and Raman Scattering techniques.

Presented by Prof. Erasmus Koena RAMMUTLA on 9 Jul 2013 from 17:40 to 18:40
Type: Poster Presentation
Session: Poster1
Track: Track A - Division for Condensed Matter Physics and Materials


Nanocrystals of Y and Zr doped SnO2 have been prepared by sol-gel route and annealed at 200, 400, 600, 800 and 1000 0C. The X-ray diffraction (XRD) results showed the average size of the particles in the freshly prepared samples to be ~ 3 nm. The Extended Absorption Fine Structure (EXAFS) technique was used to study the dopant environments in nanocrystalline tin oxide. In all Y-doped samples, except the one annealed at 1000 0C, there is clear evidence that Y has not entered the SnO2 lattice. This is clearly supported by the Raman scattering results. In all Zr-doped samples, there is a simple substitution for Sn by Zr.





Primary authors



  • Prof. AV CHADWICK University of Kent, School of Physical Sciences, Canterbury, UK
  • Dr. RM ERASMUS University of the Witwatersrand, School of Physics, Johannesburg, 2050, RSA