8-12 July 2013
A Study defects in CVD Diamond using X-Ray Diffraction And Scanning Electron Microscopy --WITHDRAWN--
Presented by Mr. MUPEMBE TSHISEKEDI
Type: Poster Presentation
Track: Track B - Nuclear, Particle and Radiation Physics
An understanding of interaction of charge carries with defects in diamonds is essential to improve the selection and processing of synthetic diamond with a view to electronic applications. In this study, the X-ray diffraction techniques, scanning microscopy were used to evaluate the defects in several diamond samples. These studies have been carried out in mapping or imaging mode so that the inhomogeneity of the samples can be considered. The results are correlated to Ion Beam Induced Charge measurements. From these studies, information on the interaction of charge carriers with defects can be extracted.
Dazmen Mavunda, e-mail:firstname.lastname@example.org University of Johannesburg