7-11 July 2014
Africa/Johannesburg timezone
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Characterisation of Aluminium/Yttrium Double-doped Tin Oxide Nanoparticles using XRD Patterns.

Presented by Mr. Tichawona DANGAISO on 8 Jul 2014 from 17:10 to 19:00
Type: Poster Presentation
Session: Poster1
Track: Track A - Division for Physics of Condensed Matter and Materials
Board #: A.435


In this report, prepared SnO2 nanoparticles were characterized using XRD patterns. A PW1830 system X-ray diffractometer with anode of Co (wavelength of 1.7889Å of Co Kα) and also that of Cu (wavelength of 1.5405Å of Cu Kα) was used to characterize the samples. Four samples of aluminium/yttrium double-doped tin oxide were previously synthesized at different temperatures (200 oC, 400 oC, 600 oC, 800 oC and 1000 oC). The powder samples were loaded into glass sample holders taking care not to have them in preferred orientations. X-ray diffraction patterns were recorded over 2θ angular ranges of 50 – 80o for Co anode and 4.3050 – 67.2190o for Cu anode with a step size of 0.025o. The crystallinity was shown to improve with an increase in temperature. Results also revealed that double doping significantly reduced the grain growth of SnO2. The lattice parameters (the d-spacing) were calculated using a computer program. The shape of the XRD patterns showed the tetragonal structure of SnO2 nanoparticles with the help of theoretical deductions.






J K Kirui, Joseph.Kirui@univen.ac.za, University of Venda




Room: D Ring ground level

Primary authors