8-12 July 2013
Africa/Johannesburg timezone
<a href="http://events.saip.org.za/internalPage.py?pageId=13&confId=32"><font color=#ff0000>SAIP2013 PROCEEDINGS AVAILABLE</font></a>

NON-SPECIALIST: Status of Aberration-corrected Transmission Electron Microscopy in South Africa

12 Jul 2013, 10:30
40m
Oral Presentation Track A - Division for Condensed Matter Physics and Materials DCMPM1

Speaker

Prof. Johannes Neethling (Director, Centre for HRTEM, Nelson Mandela Metropolitan University)

Apply to be<br> considered for a student <br> &nbsp; award (Yes / No)?

No

Level for award<br>&nbsp;(Hons, MSc, <br> &nbsp; PhD)?

N/A

Abstract content <br> &nbsp; (Max 300 words)

The development of spherical aberration-corrected electron microscopes in the 1990s has enabled sub-ångström resolution studies of nanomaterials in scanning transmission electron microscopy and transmission electron microscopy modes. Aberration-corrected electron microscopy allows the high-precision mapping of atom positions and the atomic-scale imaging of the chemical composition and nature of bonds between atoms. Since the characterisation of nanostructures down to the atomic scale is essential for the understanding of some of its physical properties, the availability of aberration-corrected electron microscopy is important for the development of nanotechnology. Interesting high resolution electron microscopy results from the Centre for High Resolution Transmission Electron Microscopy in Port Elizabeth, which was launched in October 2011, will be presented and discussed.

Main supervisor (name and email)<br>and his / her institution

Prof Jan Neethling, jan.neethling@nmmu.ac.za/ NMMU

Would you like to <br> submit a short paper <br> for the Conference <br> Proceedings (Yes / No)?

No

Primary author

Prof. Johannes Neethling (Director, Centre for HRTEM, Nelson Mandela Metropolitan University)

Co-authors

Dr Jaco Olivier (Centre for HRTEM, NMMU) Dr Jacques O'Connell (Centre for HRTEM, NMMU)

Presentation Materials

There are no materials yet.