28 June 2015 to 3 July 2015
Africa/Johannesburg timezone
SAIP2015 Proceeding published on 17 July 2016

X-ray diffraction and Raman spectroscopy based residual stress measurements for assessment of fatigue in leached polycrystalline diamond tool bits

30 Jun 2015, 15:20
20m
Oral Presentation Track F - Applied Physics Applied

Speaker

Mr Maxwell Vhareta (DST/NRF Centre of Excellence in Strong Materials, University of the Witwatersrand)

Abstract content <br> &nbsp; (Max 300 words)<br><a href="http://events.saip.org.za/getFile.py/access?resId=0&materialId=0&confId=34" target="_blank">Formatting &<br>Special chars</a>

Polycrystalline diamond (PCD) cylindrical tool-bits are complex materials systems. One aspect that has a significant influence on the in¬–service behaviour and lifetime is the residual macro-stress state created as a result of the difference in coefficients of thermal expansion (CTE) between the diamond table and the WC-Co substrate. Leached PCD, where the near-surface cobalt has been removed from the PCD layer, has a longer in-service lifetime and the reasons for this are not well understood. The measurement and study of the average in-plane stress fields on the surface of the PCD thus becomes crucial in understanding the in–service behaviour with the quest to have an extended life for the tool-bits. Two complementary non-destructive techniques namely Raman spectroscopy and X-ray diffraction have been employed for residual stress measurements on detached PCD layer samples of 16 mm in diameter and 2 mm in thickness. The Raman peak reveals both the nature and magnitude of the stress present in the material but it is essentially a surface technique with the depth penetration of the visible light being limited by the transparency of the PCD to only a few microns. The X-ray Diffraction technique probes the change in the spacing of the atomic planes of the diamond crystals with strain and has a larger penetration depth. Employing the ball on three balls fatigue set-up the samples were cyclically loaded under constant amplitude load control at a frequency of 10 Hz at room temperature and pressure conditions. Raman and XRD residual stress measurement were done as a function of the number of fatigue cycles to study the surface and near-surface stress under increasingly severe fatigue conditions. These are compared with published Raman spectroscopy results on unleached PCD.

Apply to be<br> considered for a student <br> &nbsp; award (Yes / No)?

Yes

Please indicate whether<br>this abstract may be<br>published online<br>(Yes / No)

Yes

Would you like to <br> submit a short paper <br> for the Conference <br> Proceedings (Yes / No)?

No

Main supervisor (name and email)<br>and his / her institution

Dr Rudolph Erasmus
Rudolph.Erasmus@wits.ac.za
School of Physics
University of the Witwatersrand

Level for award<br>&nbsp;(Hons, MSc, <br> &nbsp; PhD, N/A)?

PhD

Primary author

Mr Maxwell Vhareta (DST/NRF Centre of Excellence in Strong Materials, University of the Witwatersrand)

Co-authors

Prof. Darrell Comins (University of the Witwatersrand) Dr Rudolph Erasmus (University of the Witwatersrand)

Presentation Materials

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