Sputter deposition and characterization of diamond like carbon thin films
Presented by Ms. Nelisiwe Princess CHONCO on 9 Jul 2014 from 17:10 to 19:00
Type: Poster Presentation
Track: Track A - Division for Physics of Condensed Matter and Materials
Board #: A.250
Deposition of diamond like carbon (DLC) thin films were prepared by a DC magnetron sputtering on glass and silicon substrates. The characterisation techniques used are: Scanning electron microscopy (SEM) for imaging and chemical composition on the surface of the thin film. Atomic force microscopy (AFM) for studying the surface roughness of thin and thick films in coatings and Raman spectroscopy basically characterized type of carbon presence in the samples and also to check the DLC spectrum with presence of D and G peaks where G correspond to graphite while D correspond to diamond. Raman spectroscopy shows the D peak which is approximately 1360 cm-1 and the G peak is approximately 1550 cm-1. Ratio is important factor in determining whether the DLC is more diamond like or graphitic.
Prof. O.M. Ndwandwe University of Zululand