4-8 July 2016
Kramer Law building
Africa/Johannesburg timezone
Paper Review: Initial screening in progress
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Surface Brillouin scattering studies of VC thin films deposited on SiC

Presented by Mr. Kudakwashe JAKATA on 5 Jul 2016 from 16:10 to 18:00
Type: Poster Presentation
Track: Track A - Division for Physics of Condensed Matter and Materials
Board #: A.222

Abstract

The surface Brillouin scattering (SBS) technique has been used to extract the elastic stiffnesses of thin films of vanadium carbide deposited by RF magnetron sputtering on 6H-SiC substrates. SBS is a non-destructive method where there is a frequency shift in the laser light scattered from a sample due to the propagation of acoustic phonons. Atomic force microscopy (AFM) and X-ray Reflectometry (XRR) measurements have also been used to determine the surface roughness which provides an indication of the high quality of the thin films. XRR was also used to determine their thickness and density which are used as input data in calculations to determine their elastic stiffness constants using the surface wave velocity dispersion curves measured by SBS.

Award

No

Level

PhD

Supervisor

Professor J.D. Comins, Darrell.Comins@wits.ac.za, School of Physics, University of the Witwatersrand, Johannesbug

Paper

No

Permission

No

Place

Location: Kramer Law building
Address: UCT Middle Campus Cape Town
Room:


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