9-13 July 2012
Towards Quantification of Cu and Ni Using X-Ray Radiography
Presented by Mr. Lunga BAM on 10 Jul 2012 from 12:00 to 12:20
Type: Poster Presentation
Session: Applied Physics Forum
Track: Track F - Applied Physics
The correction of measured transmitted intensity (X-Rays) is important in radiography for quantification of elements. The produced polychromatic beam (tungsten spectrum) makes it difficult to quantify elements with respect to quantitative measurement. The transmitted beam through the sample will give a range of attenuation coefficients due to its polychromatic nature at the specific energy. Therefore a new method of Ratio Application has been developed to correct the measured transmitted intensity to obtain experimental attenuation coefficient that corresponds with theoretical attenuation coefficient. This correction has been applied to thin sheets of Cu and Ni samples at 100keV and 150keV (spectrum energy) and results will be presented. The purpose of this study is to eventually be able to identify small quantity of elements within the parent matrix.