8-12 July 2013
Simultaneous measurement of EFISH in transmission and in reflection from the Si/SiO2 interface of a thin Si membrane.
Presented by Mr. Wilfrid NDEBEKA on 10 Jul 2013 from 14:10 to 14:30
Type: Oral Presentation
Track: Track C - Photonics
Optical second harmonic (SH) generation is a versatile tool to investigate charge separation processes at buried interfaces of centrosymmetric systems. Using femtosecond laser pulses (800 nm, 80 fs, 80 MHz), we perform a simultaneous measurement of the electric field induced second harmonic (EFISH) in transmission and in reflection at the silicon/silicon dioxide (Si/SiO2) interface from a thin silicon membrane (~10 μm). Experimental results will be presented and discussed. We find that, in the case of reflection, the SH signal increases quadratically with incident intensity, as could be expected, and eventually saturates. However in the case of transmission, the SH signal also initially increases quadratically, reaching a maximum before decreasing with even higher input intensities. Possible explanations are presented briefly and planned future work suggested.
Erich Rohwer (email@example.com), Laser Research Institute, University of Stellenbosch
- Dr. Pieter NEETHLING Laser Research Institute, University of Stellenbosch
- Dr. Christine STEENKAMP Laser Research Institute, University of Stellenbosch
- Prof. Herbert STAFAST Institute of Photonic Technology (IPHT), Jena, Germany
- Prof. Erich ROHWER Laser Research Institute, University of Stellenbosch