4-8 July 2016
Kramer Law building
The Proceedings of SAIP2016 published on 24 December 2017
Details for Prof. TERBLANS, JJ (Koos)
Author in the following contribution(s)
Evaluation of sputtering-induced surface roughness of polycrystalline Ni/Cu multilayers thin films with AES and ToF-SIMS depth profiling
Synthesize and characterisation of optical properties of a down-converting Y2O3 phosphor co-doped with Bi3+ and Yb3+.